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Fischerscope XDLM XRF Xray Fluorescence Coating Thickness Measurement Plating Thickness Measurement Fischer Technology Bowman

Fischerscope® XDLM® 237

$0.00Price

Refurbished Fischerscope XDLM 237 X-ray fluorescence instrument. Includes the following:

- Computer loaded with WinFTM v.6 software

- ISO/IEC 17025 Calibration with Certificate

- 1 day setup and training

  • PRODUCT INFO

    The FISCHERSCOPE®-X-RAY XDLM® are universally applicable energy dispersive x-ray fluorescence measuring instruments. The instruments are well suited for non-destructive thickness measurements and analyses of thin coatings.

  • WARRANTY

    Warranties are available on most instruments. Please inquire about your specific model.

  • SHIPPING

    We ship anywhere in the Continental USA.

For pricing and availability call 847-550-1095

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