top of page
Fischerscope XDVM XRF Xray Fluorescence Coating Thickness Plating Measurement Fischer Technology Bowman Analytics

Fischerscope® XDVM®


Refurbished Fischerscope XDVM X-ray fluorescence Instrument. Includes the following:

- Computer loaded with WinFTM v.6 software

- ISO/IEC 17025 Calibration

- 1 day setup and training


    The FISCHERSCOPE®-X-RAY XDLM® are universally applicable energy dispersive x-ray fluorescence measuring instruments. The instruments are well suited  for non-destructive thickness measurements and analyses of thin coatings. 


    Warranties are available with most instruments. Please inquire about your specific model.


    We ship anywhere in the Continental USA.

For pricing and availability call 847-550-1095

bottom of page