Fischerscope XDVM XRF Xray Fluorescence Coating Thickness Plating Measurement Fischer Technology Bowman Analytics

Fischerscope® XDVM®

Refurbished Fischerscope XDVM X-ray fluorescence Instrument. Includes the following:

- Computer loaded with WinFTM v.6 software

- ISO/IEC 17025 Calibration

- 1 day setup and training

  • PRODUCT INFO

    The FISCHERSCOPE®-X-RAY XDLM® are universally applicable energy dispersive x-ray fluorescence measuring instruments. The instruments are well suited  for non-destructive thickness measurements and analyses of thin coatings. 

  • WARRANTY

    Warranties are available with most instruments. Please inquire about your specific model.

  • SHIPPING

    We ship anywhere in the Continental USA.

For pricing and availability call 847-550-1095

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